The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Nov. 14, 2019
Applicant:
Hiroshima City University, Hiroshima, JP;
Inventor:
Osamu Hiwaki, Hiroshima, JP;
Assignee:
Hiroshima City University, Hiroshima, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2021.01); A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/05 (2013.01); A61B 5/4064 (2013.01); A61B 5/6814 (2013.01); A61B 2562/0223 (2013.01);
Abstract
Magnetic field generating means () is disposed on a scalp () of a subject (P) and generates a magnetic field that is radiated from a north pole, passes through a cerebral cortex () of the subject (P) and returns to a south pole in a loop path. Magnetic field detecting means () is disposed on the scalp () and detects a change in the magnetic field () as a signal reflecting an activity status of the cerebral cortex ().
Hiwaki, Osamu. (2026). Brain function measurement device and brain function measurement method (U.S. Patent No. 12527488). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12527488
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile