The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 2026
Filed:
Nov. 17, 2022
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Renato Luiz De Freitas Cunha, Sao Paulo, BR;
Anirudh Badam, Issaquah, WA (US);
Patrick Bernd Buehler, Boston, MA (US);
Ranveer Chandra, Kirkland, WA (US);
Debasis Dan, Hyderabad, IN;
Maria Angels De Luis Blaguer, Redmond, WA (US);
Swati Sharma, Hayward, CA (US);
Fnu Aditi, Palo Alto, CA (US);
Sara Malvar Maua, Sao Paulo, BR;
MICROSOFT TECHNOLOGY LICENSING, LLC, Redmond, WA (US);
Abstract
A deep learning system is used to predict crop characteristics from inputs that include crop variety features, environmental features, and field management features. The deep learning system includes domain-specific modules for each category of features. Some of the domain-specific modules are implemented as convolutional neural networks (CNN) while others are implemented as fully-connected neural networks. Interactions between different domains are captured with cross attention between respective embeddings. Embeddings from the multiple domain-specific modules are concatenated to create a deep neural network (DNN). The prediction generated by the DNN is a characteristic of the crop such as yield, height, or disease resistance. The DNN can be used to select a crop variety for planting in a field. For a crop that is planted, the DNN may be used to select a field management technique.