The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Apr. 23, 2021
Applicant:

Lg Electronics Inc., Seoul, KR;

Inventor:

Sangwon Kim, Seoul, KR;

Assignee:

LG Electronics Inc., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/08 (2009.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 24/10 (2013.01);
Abstract

A method and apparatus for performing measurement under a long propagation delay in a wireless communication system is provided. A wireless device receives, from a network, a measurement configuration including an information on a basic measurement window and an information on a first additional measurement window. A wireless device performs a measurement within the basic measurement window. A wireless device performs a measurement within the first additional measurement window, based on measurement results from the basic measurement window. A wireless device reports, to the network, measurement results from the basic measurement window and the first additional measurement window.


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