The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Oct. 15, 2022
Applicant:

Nanovision Technology (Beijing) Co., Ltd, Beijing, CN;

Inventors:

Zhili Cui, Beijing, CN;

Yunxiang Li, Beijing, CN;

Youwei Zhang, Beijing, CN;

Qing Wei, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 23/30 (2023.01); H04N 23/73 (2023.01);
U.S. Cl.
CPC ...
H04N 23/30 (2023.01); H04N 23/73 (2023.01);
Abstract

Disclosed are an auto exposure control system and an image calibration method. The system comprises a main control unit and a plurality of auto exposure units, wherein the main control unit is connected to each of the auto exposure units; and the auto exposure units are in cascading connection. According to the system, detection of each X-ray source is realized by means of auto exposure units, such that an energy accumulation value and a KV level of X-rays are obtained; and when the energy accumulation value of X-rays reaches an energy threshold value, an auto exposure control signal is sent to a main control unit, such that the main control unit adjusts an exposure time sequence according to the auto exposure control signal, the aim of auto exposure control is achieved.


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Cui, Zhili. (2026). Auto exposure control system and image correction method (U.S. Patent No. 12526493). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12526493

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