The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Apr. 25, 2024
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Sin-Han Yang, Hsinchu, TW;

Chen-Jui Hsu, Hsinchu, TW;

Assignee:

MEDIATEK INC., Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/20 (2015.01); H04B 17/21 (2015.01);
U.S. Cl.
CPC ...
H04B 17/203 (2023.05); H04B 17/21 (2015.01);
Abstract

A method for measuring a sensitivity of a receiver is provided. The method includes: during a first stage, controlling a signal generator to transmit an input test signal to an input node of the receiver, wherein the receiver generates an output test signal on a first output node of the receiver according to the input test signal; calculating a path loss from the input node of the receiver to the first output node of the receiver according to the input test signal and the output test signal; during a second stage, measuring an output noise power on a second output node of the receiver after a load is connected to the input node of the receiver; and calculating the sensitivity of the receiver according to the path loss and the output noise power. The load may be an antenna or a 50-ohm impedance load.


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