The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Mar. 19, 2024
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Bo Xie, San Jose, CA (US);

Kang S. Yim, Palo Alto, CA (US);

Yijun Liu, Santa Clara, CA (US);

Li-Qun Xia, Cupertino, CA (US);

Ruitong Xiong, Santa Clara, CA (US);

Assignee:

Applied Materials, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/32 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02126 (2013.01); C23C 16/325 (2013.01); H01L 21/02167 (2013.01); H01L 21/02274 (2013.01); H01L 21/02205 (2013.01); H01L 21/02211 (2013.01); H01L 21/02216 (2013.01);
Abstract

Exemplary methods of forming a silicon-and-carbon-containing material may include flowing a silicon-oxygen-and-carbon-containing precursor into a processing region of a semiconductor processing chamber. A substrate may be housed within the processing region of the semiconductor processing chamber. The methods may include forming a plasma within the processing region of the silicon-and-carbon-containing precursor. The plasma may be formed at a frequency less than 15 MHz (e.g., 13.56 MHz). The methods may include depositing a silicon-and-carbon-containing material on the substrate. The silicon-and-carbon-containing material as-deposited may be characterized by a dielectric constant below or about 3.5 and a hardness greater than about 3 Gpa.


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