The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

May. 16, 2023
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Yu Zhao, Shenzhen, CN;

Zhenyu Lin, Shenzhen, CN;

Jianhua Yao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06V 10/26 (2022.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06V 10/764 (2022.01); G06V 10/26 (2022.01); G06V 10/44 (2022.01); G06V 2201/03 (2022.01);
Abstract

Disclosed are an image classification method performed by a computer device. The method includes: acquiring an image feature of a pathological image; extracting, for each scale in multiple scales, a local feature corresponding to the scale from the image feature; splicing the local features respectively corresponding to the scales to obtain a spliced image feature; and classifying the spliced image feature to obtain a category to which the pathological image belongs. According to the method provided in the embodiments of this application, the local features corresponding to different scales contain different information, so that the finally obtained spliced image feature contains feature information corresponding to different scales, and the feature information of the spliced image feature is enriched. The category to which the pathological image belongs is determined based on the spliced image feature, so that the accuracy of the category is ensured.


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