The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Feb. 02, 2023
Method and apparatus for optimum overlap ratio estimation for three dimensional (3d) reconstructions
Qualcomm Incorporated, San Diego, CA (US);
Siddhant Sanjay Shirguppe, Belgaum, IN;
Ajay Surendranath, Bengaluru, IN;
Srikanth Thatipamula, Telangana, IN;
Manoj Surya K, Bengaluru, IN;
QUALCOMM INCORPORATED, San Diego, CA (US);
Abstract
Techniques and systems are provided for image processing. For instance, a process can include obtaining pose information for an image sensor, the pose information indicating a set of viewpoints of an environment, wherein the image sensor is configured to capture frames for reconstructing an object; fitting a curve to the set of viewpoints; determining one or more characteristics of a curve; determining a direction of the image sensor based on the one or more characteristics of the curve and the set of viewpoints; determining an overlap ratio based on the one or more characteristics of the curve and the determined direction of the image sensor; and outputting the determined overlap ratio for selecting frames to be used for reconstructing the object.