The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Feb. 06, 2022
Nanjing Agricultural University, Jiangsu, CN;
Xia Yao, Nanjing, CN;
Wei Li, Nanjing, CN;
Tao Cheng, Nanjing, CN;
Yan Zhu, Nanjing, CN;
Yongchao Tian, Nanjing, CN;
Weixing Cao, Nanjing, CN;
Dong Li, Nanjing, CN;
Hengbiao Zheng, Nanjing, CN;
Yu Zhang, Nanjing, CN;
Jifeng MA, Nanjing, CN;
Xue Wang, Nanjing, CN;
Caili Guo, Nanjing, CN;
NANJING AGRICULTURAL UNIVERSITY, Nanjing, CN;
Abstract
A method for improving estimation of leaf area index in an early growth stage of wheat based on red-edge bands of Sentinel-2 satellite images includes the following steps: acquiring field background spectrum and wheat canopy spectrum information by means of Sentinel-2; respectively acquiring a 'straw-soil' spectrum and a “wheat-straw-soil” spectrum, and calculating slopes of red-edge areas of the “straw-soil” spectrum and the “wheat-straw-soil” spectrum; calculating a tangent function SATF corrected by a background adjustment coefficient α; constructing a wheat LAI estimation model based on a spectral variable SATF; performing preliminary screening on the LAI estimation model using cross validation; and then testing the screened model with independent data.