The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Oct. 14, 2020
United States Government As Represented BY the Department of Veterans Affairs, Washington, DC (US);
University of South Florida, Tampa, FL (US);
Matthew J. Peterson, Tampa, FL (US);
Linda J. Cowan, Tampa, FL (US);
Kimberly S. Hall, Tampa, FL (US);
Dmitry Goldgof, Tampa, FL (US);
Sudeep Sarkar, Tampa, FL (US);
Chih-Yun Pai, Tampa, FL (US);
Hunter Morera, Tampa, FL (US);
Yu Sun, Tampa, FL (US);
The United States Government as Represented by the Department of Veterans Affairs, Washington, DC (US);
Abstract
Methods and systems for imaging and analysis are described. Accurate pressure ulcer measurement is critical in assessing the effectiveness of treatment. However, the traditional measuring process is subjective. Each health care provider may measure the same wound differently, especially related to the depth of the wound. Even the same health care provider may obtain inconsistent measurements when measuring the same wound at different times. Also, the measuring process requires frequent contact with the wound, which increases risk of contamination or infection and can be uncomfortable for the patient. The present application describes a new automatic pressure ulcer monitoring system (PrUMS), which uses a tablet connected to a 3D scanner, to provide an objective, consistent, non-contact measurement method. The present disclosure combines color segmentation on 2D images and 3D surface gradients to automatically segment the wound region for advanced wound measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile