The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Sep. 26, 2023
Topcon Corporation, Tokyo, JP;
Takeshi Kikuchi, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
A bar arrangement inspection system includes a scanner for acquiring three-dimensional point cloud data of an inspection range, a camera for acquiring image data of the inspection range, a processor, and three-dimensional bar arrangement design data of the inspection range, the processor is configured to receive the three-dimensional point cloud data of the inspection range from the scanner and the image data of the inspection range from the camera, generate a point cloud composite image by combining the three-dimensional point cloud data with the image data, identify a bar arrangement state and positions of reinforcing bars included in the point cloud composite image, and by comparing the point cloud composite image with the three-dimensional bar arrangement design data, generate three-dimensional bar arrangement state inspection result data, and output the bar arrangement state inspection result data in such a manner that the bar arrangement error is visually identifiable.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile