The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Apr. 12, 2022
Applicant:

Google Llc, Mountain View, CA (US);

Inventors:

Brian David Lester, Mountain View, CA (US);

Rami Al-Rfou, Menlo Park, CA (US);

Noah Constant, Los Angeles, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/20 (2019.01); G06F 16/2455 (2019.01); G06F 16/55 (2019.01); G06F 40/30 (2020.01); G06N 3/0455 (2023.01); G06N 3/08 (2023.01); G06N 3/084 (2023.01); G06V 10/44 (2022.01); G06V 10/764 (2022.01); G06V 10/774 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 20/20 (2019.01); G06V 10/764 (2022.01); G06V 10/7747 (2022.01); G06F 16/2455 (2019.01); G06F 16/55 (2019.01); G06F 40/30 (2020.01); G06N 3/0455 (2023.01); G06N 3/08 (2013.01); G06N 3/084 (2013.01); G06V 10/454 (2022.01); G06V 10/776 (2022.01); G06V 10/82 (2022.01);
Abstract

Systems and methods for natural language processing can leverage trained prompts to condition a large pre-trained machine-learned model to generate an output for a specific task. For example, a subset of parameters may be trained for the particular task to then be input with a set of input data into the pre-trained machine-learned model to generate the task-specific output. During the training of the prompt, the parameters of the pre-trained machine-learned model can be frozen, which can reduce the computational resources used during training while still leveraging the previously learned data from the pre-trained machine-learned model.


Find Patent Forward Citations

Lester, Brian. (2026). Parameter efficient prompt tuning for efficient models at scale (U.S. Patent No. 12524711). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12524711

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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