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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12524592 B1

PDFFull Text
Date of Patent:
Jan. 13, 2026

Filed:

Jul. 10, 2020

Verification processing device, verification method, and program

Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Kenji Takao, Tokyo, JP;

Keita Hirayama, Tokyo, JP;

Kenta Masumori, Yokohama, JP;

Assignee:

MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;

Attorney:

HAUPTMAN HAM, LLP

Primary Examiner:

Phallaka Kik

Int. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 11/3604 (2025.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/3323 (2020.01); G06F 11/3608 (2013.01); G06F 30/20 (2020.01); G06F 30/3308 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06F 2119/02 (2020.01);
Abstract

A verification processing device includes: an inspection processing unit which extracts elements of which states change in a process leading to an insecure event by means of a model inspection for a model to be inspected; a refinement processing unit which determines, for each of the extracted elements, whether the element contributes to the occurrence of the insecure event and refines a cause element which is an element of a cause of the insecure event; and a receiving unit which receives, from an operator, a selection of at least one cause element from among a plurality of the cause elements, wherein the inspection processing unit performs the model inspection once again on an improved model to be inspected which is a new model to be inspected in which a prescribed measure is executed for the selected cause element.

Find Patent Forward Citations

Takao, Kenji. (2026). Verification processing device, verification method, and program (U.S. Patent No. 12524592). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12524592

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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