The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Feb. 18, 2022
Hitachi Astemo, Ltd., Hitachinaka, JP;
Daijiro Murata, Tokyo, JP;
Masanori Kaneko, Tokyo, JP;
Daisuke Shimbara, Tokyo, JP;
Naoto Hasegawa, Hitachinaka, JP;
Akiharu Sato, Hitachinaka, JP;
Hitachi Astemo, Ltd., Hitachinaka, JP;
Abstract
An analysis device specifies a cause when a test of test target software fails in a test environment that is an environment for executing a test. In the test, execution of test target software and confirmation of an execution result are executed by a test script without human intervention. Test data is data read into the test target software and the test script when the test is executed. The analysis device includes: a score calculation unit that calculates a failure cause score for each of test target software, test data, a test script, and a test environment based on the presence or absence of a change; and an estimation unit that estimates, based on a failure cause score, whether the test has failed due to test target software, test data, a test script, or a test environment.