The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Sep. 21, 2022
Applicant:

Elliptic Laboratories Asa, Oslo, NO;

Inventors:

Espen Klovning, Strømmen, NO;

John Magne Helgesen Røe, Sørumsand, NO;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/32 (2019.01); G06F 1/3231 (2019.01); G06F 1/3234 (2019.01); G06N 3/02 (2006.01);
U.S. Cl.
CPC ...
G06F 1/3234 (2013.01); G06F 1/3231 (2013.01); G06N 3/02 (2013.01);
Abstract

The present invention relates to a method and an electronic device including at least two measuring units, wherein a first measuring unit is an active measuring unit emitting and receiving a signal related to a first chosen parameter in a sequence, said sequence having inactive periods, and wherein the second measuring unit comprises an essentially continuous measurement of a predetermined second parameter, the second measuring unit having a lower power consumption than the first measuring unit. The first parameter is related to a proximity measurement configured to measure the proximity of an object in the vicinity of the device and the second parameter being related to a measure of the activity of the device. The device including a processing unit coupled to said measurement units and being configured to register deviation in the second parameter and at a predetermined deviation alter the sequency of the first measurement.


Find Patent Forward Citations

Loading…