The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Apr. 29, 2020
Applicant:
Dürr Systems Ag, Bietigheim-Bissingen, DE;
Inventors:
Frank Herre, Oberriexingen, DE;
Michael Zabel, Winnenden, DE;
Dietmar Wieland, Waiblingen, DE;
Sören Wehler, Ludwigsburg, DE;
Assignee:
Dürr Systems AG, Bietigheim-Bissingen, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); B05B 12/08 (2006.01); B05B 13/04 (2006.01); B05B 14/43 (2018.01); B05B 16/20 (2018.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); B05B 12/084 (2013.01); B05B 13/0452 (2013.01); B05B 14/43 (2018.02); B05B 16/20 (2018.02); G05B 2219/32368 (2013.01);
Abstract
In order to provide a checking facility for checking workpieces and also a treatment facility for treating workpieces, which enable efficient and reliable quality optimisation, it is proposed that workpiece parameters are detected, for example by means of an automatic checking station, and a workpiece-specific data set is created on this basis and/or from facility parameters.
Herre, Frank. (2026). Method for checking workpieces, checking facility and treatment facility (U.S. Patent No. 12523992). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12523992
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile