The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Aug. 09, 2019
The Research Foundation for the State University of New York, Buffalo, NY (US);
Rahul Rai, East Amherst, NY (US);
Prakhar Jaiswal, Buffalo, NY (US);
Abstract
Shape diameter-based approaches to identifying and correcting 2D slices of 3D models (or the 3D models themselves) are provided for improved manufacturability. Using the present approaches, critical error-prone regions in 2D slices or 3D models can be identified, including thin extrusions and bridges, sharp corners, small holes, and narrow intrusions. The areas of these regions can be computed and used to quantify the printability of the slices or models. The boundaries of slices or models can be modeled as mass-spring-damper systems for performing local deformations to correct error-prone regions. External forces, that are a function of shape diameters and interior angles, can be imposed on the modeled systems for this purpose.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile