The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Apr. 26, 2022
Raytheon Technologies Corporation, Farmington, CT (US);
Derek J. Michaels, Vernon, CT (US);
Ron I. Prihar, West Hartford, CT (US);
Becky E. Rose, Colchester, CT (US);
RTX CORPORATION, Farmington, CT (US);
Abstract
A plurality of potential repair processes for a stack of IBRs may be determined. Each repair process may be associated with a defect on an inspected IBR. A finite element model of the stack of IBRs may be generated to model a potential repaired defect of each inspected IBR. The model may also include a plurality of vane stages disposed between adjacent inspected IBRs and an engine case. A structural analysis and an aerodynamic analysis may be performed. Whether the stack of IBRs with the potential repaired defect meets a structural criteria and an aerodynamic criteria may be determined. Each IBR in the stack of IBRs may be repaired with the repair process for the potential repaired defect for each inspected IBR in the stack of IBRs in response to determining the stack of IBRs meets the structural criteria and the aerodynamic criteria.