The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Dec. 09, 2021
Applicant:

Korea Institute of Radiological & Medical Sciences, Seoul, KR;

Inventors:

Gun A Kim, Seoul, KR;

Jong Guk Kim, Seongnam-si, KR;

Il Han Lim, Seoul, KR;

Byoung Soo Kim, Suwon-si, KR;

Kang Hyon Song, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/36 (2006.01); G01T 1/167 (2006.01);
U.S. Cl.
CPC ...
G01T 1/36 (2013.01); G01T 1/167 (2013.01);
Abstract

The present invention relates to a method for analyzing an alpha-ray spectrum obtained from a radiation source, wherein the radiation source includes a first nuclide and a second nuclide that are different from each other, the method comprising the steps of: obtaining simulated spectra for alpha rays emitted from the first nuclide and the second nuclide through a simulation using radioactivity functions of the first nuclide and the second nuclide; measuring alpha rays emitted from the radiation source to obtain an alpha-ray spectrum; and decomposing the alpha-ray spectrum into a first alpha-ray spectrum emitted from the first nuclide and a second alpha-ray spectrum emitted from the second nuclide, on the basis of the simulated spectra.


Find Patent Forward Citations

Kim, Gun. (2026). Method for analyzing alpha-ray spectrum obtained from radiation source (U.S. Patent No. 12523788). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12523788

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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