The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Mar. 01, 2022
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Sven Fischer, Nuremberg, DE;

Stephen William Edge, Escondido, CA (US);

Alexandros Manolakos, Escondido, CA (US);

Sony Akkarakaran, Poway, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); G01S 5/00 (2006.01); G01S 5/02 (2010.01); H01Q 9/04 (2006.01); H04L 5/00 (2006.01);
U.S. Cl.
CPC ...
G01S 5/0236 (2013.01); G01S 5/0063 (2013.01); H04L 5/0051 (2013.01);
Abstract

Techniques are discussed herein for providing on-demand positioning reference signals (PRS) to user equipment (UE). An example method for determining a location of a user equipment according to the disclosure includes receiving a first assistance data associated with a first positioning reference signal configuration, transmitting a request to modify one or more parameters of the first positioning reference signal configuration, receiving a second assistance data associated with a second positioning reference signal configuration, wherein the second positioning reference signal configuration is based at least in part on the request to modify the one or more parameters of the first positioning reference signal configuration, obtaining measurements from one or more positioning reference signals based at least in part on the second assistance data, and determining the location based at least on part on measurements obtained from the one or more positioning reference signals.


Find Patent Forward Citations

Loading…