The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Dec. 09, 2022
Applicant:

Honor Device Co., Ltd., Shenzhen, CN;

Inventors:

Dong Liu, Shenzhen, CN;

Jing Zhao, Shenzhen, CN;

Assignee:

Honor Device Co., Ltd., Shenzhen, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/52 (2020.01); G01J 5/00 (2022.01); G01J 5/48 (2022.01);
U.S. Cl.
CPC ...
G01R 31/52 (2020.01); G01J 5/0096 (2013.01); G01J 5/48 (2013.01); G01J 2005/0077 (2013.01);
Abstract

This application provides an electric leakage detection method for an electronic component, an electronic device, and a storage medium, and relates to the field of electric leakage protection technologies for electronic components. The method includes: acquiring, by the electronic device when the electronic device executes the target task, a target temperature value at a target position on the first electronic component measured by a target temperature sensor, where the target temperature sensor is one of the plurality of second electronic components; determining, by the electronic device, a target temperature reference value corresponding to the target position from the temperature distribution information of the first electronic component; and determining, by the electronic device when a difference value between the target temperature value and the target temperature reference value is greater than or equal to a first threshold, that the first electronic component leaks electricity.


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