The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Dec. 27, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Yoshiyuki Watabe, Kyoto, JP;

Yoshihiro Hayakawa, Kyoto, JP;

Tetsuo Iida, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/34 (2006.01); G01N 30/16 (2006.01); G01N 30/46 (2006.01); G01N 30/84 (2006.01);
U.S. Cl.
CPC ...
G01N 30/34 (2013.01); G01N 30/16 (2013.01); G01N 30/46 (2013.01); G01N 30/84 (2013.01);
Abstract

A two-dimensional liquid chromatograph system includes a first dimension analysis part, a second dimension analysis part, a second dimension feeding device, a fraction introduction part, a shift gradient program creation part, a liquid feeding control part, and a shift timing adjustment part. The shift gradient program creation part is configured to create a shift gradient program for causing the second dimension feeding device to execute shift gradient liquid feeding. The shift timing adjustment part is configured to adjust a shift timing to each stage in the shift gradient program created by the shift gradient program creation part based on a preliminary chromatogram acquired by the first dimension detector before the series of analysis operations for the sample to be analyzed.


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