The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Mar. 10, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Goshi Akiyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/204 (2013.01);
Abstract

An aperture member narrows an irradiation range of primary X-rays generated by an X-ray tube. The analysis unit analyzes fluorescent X-rays generated from a sample when the sample is irradiated with the primary X-rays that have passed through the aperture member. The aperture member includes a first opening formed on an incident side of the primary X-rays, a second opening formed on an emission side of the primary X-rays, and a hole formed between the first opening and the second opening to allow the primary X-rays to pass through. The aperture member includes a shielding portion formed on an inner surface of the hole, the shielding portion being formed between the X-ray tube and the peripheral portion of the second opening and on a side outer than a straight line connecting the X-ray tube and the edge portion of the second opening.


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