The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Apr. 11, 2023
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Hideaki Fukuzawa, Tokyo, JP;

Tomohito Mizuno, Tokyo, JP;

Tetsuya Shibata, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01); G01N 2201/06113 (2013.01);
Abstract

An analysis device includes: at least one magnetic element having a first ferromagnetic layer, a second ferromagnetic layer, and a spacer layer sandwiched between the first ferromagnetic layer and the second ferromagnetic layer; and a light source configured to emit a light, wherein the light is applied to an object to be analyzed, and the at least one magnetic element is configured to detect a reflected light reflected by the object or a transmitted light transmitted through the object.


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