The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2026
Filed:
Jan. 02, 2024
1finity Inc., Kawasaki, JP;
Inwoong Kim, Allen, TX (US);
Olga I. Vassilieva, Plano, TX (US);
Ryu Shinzaki, Kawasaki, JP;
Motohiko Eto, Kawasaki, JP;
Shoichiro Oda, Tokyo, JP;
Paparao Palacharla, Richardson, TX (US);
1FINITY Inc., Kawasaki, JP;
Abstract
A method may include obtaining a first waveform corresponding to a first optical signal received at a first optical receiver via an optical link, and a second waveform profile corresponding to a second optical signal received a second optical receiver. The first waveform profile and the second waveform profile may be combined to form a combined waveform profile. A first reconstructed waveform profile that is an estimate of the first waveform profile and a second reconstructed waveform profile that is an estimate of the second waveform profile may be obtained. The first reconstructed waveform profile and the second reconstructed waveform profile may be combined to form a combined reconstructed waveform profile which may be emulated to obtain an emulated reconstructed waveform profile. A power profile estimation corresponding to the optical ink may be determined based on a comparison between the combined waveform profile and the emulated reconstructed waveform profile.