The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Aug. 29, 2023
Applicant:

Trioptics Gmbh, Wedel, DE;

Inventors:

Ralf Poikat, Wedel, DE;

Albert Milczarek, Wedel, DE;

Frank Peter, Wedel, DE;

Assignee:

Trioptics GmbH, Wedel, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 11/02 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0292 (2013.01); G01M 11/0214 (2013.01);
Abstract

A device for measuring imaging properties of an optical system including: a rigid holding device; and MTF measuring devices arranged at predefined positions of the holding device such that, by each of the MTF measuring devices, a modulation transfer function can be measured at respective different, predefinable, angular positions in the image field of the optical system; wherein the holding device includes at least a first holder and a second holder; the MTF measuring devices include a first group and a second group; the first holder holds the first group at first positions so that the first group are arranged on a first spherical shell; the second holder holds the second group at second positions so that the second group are arranged on a second spherical shell; and the first spherical shell and the second spherical shell have different radii and are arranged so as to be mutually concentric.


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