The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 2026

Filed:

Jun. 23, 2021
Applicant:

The Catholic University of Korea Industry-academic Cooperation Foundation, Seoul, KR;

Inventors:

Yong Chan Kim, Seoul, KR;

Dong Jin Chang, Seoul, KR;

So Jin Park, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/12 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); G06F 18/2411 (2023.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
A61B 3/12 (2013.01); A61B 3/0025 (2013.01); A61B 3/102 (2013.01); G06F 18/2411 (2023.01); G16H 50/20 (2018.01);
Abstract

A method of determining pathologic myopia by using the geometric structure of a posterior sclera of a fundus includes obtaining geometric location data about a fovea, an optic disc, and a deepest point of the eye (DPE) in the posterior sclera of the fundus; obtaining an elevation difference TEPSbetween the fovea and the DPE, an elevation difference TEPSbetween the optic disc and the DPE, and an elevation difference TEPSbetween the fovea and the optic disc by using location information about the fovea, the optic disc, and the DPE in the posterior sclera; and determining pathologic myopia by using at least two elevation differences selected from among the elevation difference TEPSbetween the fovea and the DPE, the elevation difference TEPSbetween the optic disc and the DPE, and the elevation difference TEPSbetween the fovea and the optic disc.


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