The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Nov. 28, 2022
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chia-Lung Tsai, Kaohsiung, TW;

Hsueh-Hsing Liu, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10D 62/82 (2025.01); H10D 30/66 (2025.01); H10H 20/815 (2025.01);
U.S. Cl.
CPC ...
H10D 62/82 (2025.01); H10D 30/668 (2025.01); H10H 20/815 (2025.01);
Abstract

Provided is a semiconductor substrate with a balance stress. The semiconductor substrate includes a ceramics base, a nucleation layer and a first buffer layer doped with a first dopant. The ceramics base has an off-cut angle other than 0 degree. The nucleation layer is disposed on the ceramics base. The first buffer layer is disposed on the nucleation layer. The first dopant includes C, Fe or a combination thereof. The first buffer layer provides compressive stress to the ceramic base. The concentration of the first dopant in the first buffer layer is increased away from the ceramics base. The curvature of the semiconductor substrate is between 16 kmand −16 km.


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