The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Oct. 25, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Huaning Niu, San Jose, CA (US);

Chunxuan Ye, San Diego, CA (US);

Dawei Zhang, Saratoga, CA (US);

Haitong Sun, Cupertino, CA (US);

Hong He, San Jose, CA (US);

Oghenekome Oteri, San Diego, CA (US);

Seyed Ali Akbar Fakoorian, San Diego, CA (US);

Wei Zeng, Saratoga, CA (US);

Weidong Yang, San Diego, CA (US);

Yushu Zhang, Beijing, CN;

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 74/08 (2024.01); H04L 5/00 (2006.01); H04W 16/14 (2009.01); H04W 74/0808 (2024.01);
U.S. Cl.
CPC ...
H04W 74/0808 (2013.01); H04L 5/0048 (2013.01); H04W 16/14 (2013.01);
Abstract

Some aspects of this disclosure relate to apparatuses and methods for implementing techniques for a use equipment (UE) to determine, based on a transmission configuration indicator (TCI) state, a sensing beam to wirelessly communicate with a base station over a channel in an unlicensed spectrum. The UE can receive, using a receiving beam, control information including a TCI state, determine a sensing beam indicated by the TCI state included in the control information, sense a channel occupancy of the channel between the UE and the base station by performing Clear Channel Assessment using the sensing beam. Furthermore, the UE can determine, based on the channel occupancy, whether the channel is free to be utilized for communication by the UE using the sensing beam.


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