The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Mar. 23, 2022
Qualcomm Incorporated, San Diego, CA (US);
Vishwesh Pratap Rege, Bellevue, WA (US);
Raj Kumar Nattha, San Diego, CA (US);
Jyothi Kiran Vattikonda, San Diego, CA (US);
Yongle Wu, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, and devices for wireless communication are described for measurement reporting in beamformed communications. A user equipment (UE) may establish a connection with a serving cell using one or more refined beams, and may measure one or more quality metrics of the serving cell using a wider beam than the refined beam, which may provide a uniform comparison with measured quality metrics of other cells using wider beams. Further, the UE may apply a time threshold to one or more quality metric measurements to exclude older measurements from a measurement report. A base station or serving cell may configure the UE to perform quality metric measurements and apply time thresholds for reporting measurements, which may be enabled or disabled based on one or more parameters.