The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Mar. 10, 2023
Applicants:

University of Maryland, College Park, College Park, MD (US);

Government of the United States of America As Represented BY the Secretary of Commerce, Gaithersburg, MD (US);

Inventors:

Wenqi Zhu, Vienna, VA (US);

Amit Kumar Agrawal, Rockville, MD (US);

Lu Chen, Gaithersburg, MD (US);

Henri J. Lezec, Silver Spring, MD (US);

Assignee:

University of Maryland, College Park, College Park, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/95 (2023.01); H04N 13/232 (2018.01); H04N 23/55 (2023.01); H04N 23/67 (2023.01); H04N 23/957 (2023.01);
U.S. Cl.
CPC ...
H04N 23/957 (2023.01); H04N 13/232 (2018.05); H04N 23/55 (2023.01);
Abstract

A chiral light-field optical imaging camera incorporating an array of photonic spin-multiplexed bifocal metalenses. Combined with a novel deep learning-based neural network reconstruction algorithm, the system provides distinct aberration-free photographic capabilities, including the ability to achieve a polarization controllable extremely large depth-of-field optical imaging across a range of distances within a range covering at least five orders of magnitude in absence of moving a part of the camera and based on a single exposure of an optical detector while maintaining high spatial lateral resolution.


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