The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Nov. 08, 2022
Applicant:

Sharp Kabushiki Kaisha, Sakai, JP;

Inventors:

Keiichiro Takada, Sakai, JP;

Tomohiro Ikai, Sakai, JP;

Takeshi Chujoh, Sakai, JP;

Tomoko Aono, Sakai, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/80 (2014.01); H04N 19/186 (2014.01);
U.S. Cl.
CPC ...
H04N 19/80 (2014.11); H04N 19/186 (2014.11);
Abstract

In a case that all network parameters are adaptively switched, it is difficult to switch the parameters for each small block, such as a CTU. There is a problem in that, in a case that ALF class classification and filtering are successively performed in ALF parallel after application of an NN filter, processing requires time. By selecting an NN model in a slice header and selecting a network layer finetuned in a CTU, the NN model can be adaptively selected even for each small block. By performing ALF class classification in an image before being subjected to an NN filter and performing ALF processing using an image subjected to NN filtering processing and ALF class information, the NN filtering processing and the ALF class classification can be performed in parallel.


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