The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Apr. 11, 2023
Bar Ilan University, Ramat Gan, IL;
Zeev Zalevsky, Rosh HaAyin, IL;
BAR ILAN UNIVERSITY, Ramat Gan, IL;
Abstract
A system is presented for imaging objects through scattering medium. The system includes an imaging system including: light source generating input light forming coherent illumination of selected wavelength range(s); beam shaping unit generating selectively varying wavefront patterns of the input light forming wavefront shaped coherent illumination propagating through the scattering medium to an object region; interferometric unit; and detection unit comprising pixelated detector(s) detecting output light originated at said object being illuminated and passed through said scattering medium, and generating measured data comprising amplitude and phase of the output light and image data about the object. Beam shaping controller analyzes the measured data and generates operational data to the beam shaping unit to produce optimized wavefront shaped coherent illumination comprising multiple illumination spots focused on different focal planes at the object region and different lateral locations in each focal plane, to extract 3D structure of the object from image data.