The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jul. 28, 2023
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Takeyuki Suda, Chiba, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/00 (2006.01);
U.S. Cl.
CPC ...
H04N 1/00482 (2013.01); H04N 1/00015 (2013.01); H04N 1/00034 (2013.01); H04N 1/00045 (2013.01); H04N 1/00082 (2013.01);
Abstract

An inspection system including a reading apparatus configured to read an image formed on a sheet and to output a read image, a display configured to display a setting screen for setting an inspection condition for inspecting the read image, and a processor configured to set the inspection condition including an inspection area of an image, a type of inspection, and an inspection level, wherein the inspection area is automatically set by the processor analyzing a content of a reference image, wherein operation through the setting screen enables displaying the inspection area automatically set by the processor, enabling selection of a specific type of inspection for the inspection area from a plurality of inspection types, and setting an inspection level for the specific type of inspection


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