The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

May. 07, 2024
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Nidhin Mulangattil Sudhakaran, Unterhaching, DE;

Eashwar Thiagarajan, Bothell, WA (US);

Bert Sullam, Bellevue, WA (US);

Ding MA, Kirkland, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/08 (2006.01);
U.S. Cl.
CPC ...
H03M 1/0827 (2013.01);
Abstract

One or more computing devices, systems, and/or methods are provided. In an example of the techniques presented herein, a method is provided. The method includes generating a bias signal based on an index, connecting a first amplifier of a first programmable analog block to a sensor terminal, and amplifying a sensor signal received at the sensor terminal in the first amplifier based on the bias signal to generate an amplified sensor signal. The amplified sensor signal is sampled to generate an output sample. Responsive to detecting a limit violation associated with the output sample, the index is modified to generate a modified index and the bias signal is adjusted based on the modified index.


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