The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jun. 16, 2023
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Kuan-Yu Chen, Taichung, TW;

Chun-Min Wang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H03F 3/24 (2006.01); H04B 1/04 (2006.01);
U.S. Cl.
CPC ...
H03F 3/24 (2013.01); H04B 1/0466 (2013.01); H03F 2200/105 (2013.01); H03F 2200/451 (2013.01); H04B 2001/0408 (2013.01);
Abstract

Implementations disclosed describe techniques and systems for calibrating parameters of a radio frequency power amplifier. The disclosed techniques include, among other things, identifying an initial power amplifier (PA) parameter set of a radio frequency (RF) module. A plurality of candidate PA parameter sets is generated. A set of error values for each of the plurality of candidate PA parameter sets is determined. A subset of the plurality of candidate PA parameter sets is identified. Each error value of the set of error values of each candidate parameter set in the subset satisfies an error threshold. A final PA parameter set is stored.


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