The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Jul. 19, 2022
Applicants:
Yung-chieh Hsieh, San Jose, CA (US);
Chiayu Ai, Newark, CA (US);
Inventors:
Yung-Chieh Hsieh, San Jose, CA (US);
Chiayu AI, Newark, CA (US);
Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 3/00 (2006.01); G02B 27/09 (2006.01); G02B 27/12 (2006.01);
U.S. Cl.
CPC ...
H01S 3/005 (2013.01); G02B 27/0972 (2013.01); G02B 27/126 (2013.01);
Abstract
Methodology of forming a substantially flat-top illuminating light beam, from a beam at the laser output having a conventionally non-uniform distribution of irradiance, with the use of only a birefringent prismatic element and light-focusing optics. Preferably, the cross-sectional area of such illuminating light distribution is shaped to be elongated or even substantially rectangular to have it used advantageously in various metrological situations such as, for example, the operation of a moving particle analyzer.