The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Apr. 08, 2024
Applicant:

Sunrise Memory Corporation, San Jose, CA (US);

Inventors:

Masahiro Yoshihara, Yokohama, JP;

Takashi Hirotani, Kanagawa, JP;

Assignee:

SUNRISE MEMORY CORPORATION, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G11C 5/06 (2006.01); G11C 16/08 (2006.01); H10B 43/10 (2023.01); H10B 43/27 (2023.01); H10B 51/10 (2023.01); H10B 51/20 (2023.01); H10D 30/69 (2025.01); H10D 64/01 (2025.01); H10D 64/68 (2025.01); G11C 11/16 (2006.01);
U.S. Cl.
CPC ...
G11C 16/0483 (2013.01); G11C 5/063 (2013.01); G11C 16/08 (2013.01); H10B 43/10 (2023.02); H10B 43/27 (2023.02); H10B 51/10 (2023.02); H10B 51/20 (2023.02); H10D 30/701 (2025.01); H10D 64/033 (2025.01); H10D 64/689 (2025.01); G11C 11/1673 (2013.01);
Abstract

A memory circuit includes an array of thin-film ferroelectric memory transistors formed by an array of NOR memory strings intersecting with local word line structures with global word lines arranged orthogonal to the array of NOR memory strings and aligned with a set of local word line structures provided across multiple stacks of NOR memory strings. The memory circuit includes a word line select transistor associated with each local word line structure to isolate each local word line structure from the associated global word line. The word line select transistor, when activated, selectively couples a selected local word line structure to the associated global word line. Remaining local word line structures associated with the same global word line remain disconnected and therefore not selected. In this manner, parasitic capacitance on the global word line is reduced and unintended disturb to other unselected memory transistors is also reduced.


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