The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Sep. 06, 2023
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventors:

Adrien Carre, Brooklyn, NY (US);

Jakub Dominik Bochynski, Tarnobrzeg, PL;

Azimjon Pulatov, Warsaw, PL;

Konrad Ryszard Budzynski, Wroclaw, PL;

Carlos Emmanuel Gonzalez Sandoval, Franklin, MA (US);

Sarah Keating Traylor, Hingham, MA (US);

Vivek Gupta, Somerville, MA (US);

Assignee:

AMAZON TECHNOLOGIES, INC., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/30 (2020.01); G10L 15/01 (2013.01); G10L 15/06 (2013.01); G10L 15/18 (2013.01); G10L 15/183 (2013.01);
U.S. Cl.
CPC ...
G10L 15/01 (2013.01); G10L 15/063 (2013.01); G10L 15/1815 (2013.01); G10L 15/183 (2013.01);
Abstract

Devices and techniques are generally described for semantic clustering and fixing of like-failed processing inputs. In some examples, first embedding data representing a first input may be generated. A first cluster of embeddings including the first embedding data may be generated. Second embedding data of the first cluster may be determined. First metadata for the first input may be determined. The first metadata may be associated with processing of the first input by the processing system. Second metadata for the second input may be determined. A first remedial action may be determined for processing the first input based at least in part on the first metadata and the second metadata.


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