The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Feb. 12, 2024
Applicant:

Future Dial, Inc., Sunnyvale, CA (US);

Inventors:

Yan Zhou, Mountain View, CA (US);

George Huang, Los Altos Hills, CA (US);

Jisheng Li, Los Altos, CA (US);

Assignee:

Future Dial, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/75 (2022.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06V 10/98 (2022.01); G06T 7/001 (2013.01); G06V 10/759 (2022.01); G06T 2200/24 (2013.01); G06T 2207/30108 (2013.01);
Abstract

A method is disclosed that includes receiving, by a processing device, a plurality of images of a test assembly. The processing device selects a component in the test assembly and an image of the plurality of images of the test assembly as received. For the component as selected and the image as selected, the processing device compares a plurality of portions of the image as selected to a corresponding plurality of portions of a corresponding profile image and computing a matching score for each of the plurality of portions. The processing device selects a largest matching score from the matching score for each of the plurality of portions as a first matching score for the component as selected and the image as selected. The first matching score is stored for the component as selected and the image as selected.


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