The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Oct. 05, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Hayato Itsumi, Tokyo, JP;

Koichi Nihei, Tokyo, JP;

Yusuke Shinohara, Tokyo, JP;

Takanori Iwai, Tokyo, JP;

Florian Beye, Tokyo, JP;

Charvi Vitthal, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/215 (2017.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/215 (2017.01); G06T 5/20 (2013.01); G06T 5/50 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/30252 (2013.01);
Abstract

A region prediction unit predicts the target region in the second image frame based on the target region detected in a first image frame and a time interval between the first and second image frames. The region prediction unit predicts the target region in the third image frame based on the target region detected in the second image frame and a time interval between the second and third image frames. A region determination unit determines, as an image-processing region, a region obtained by adding a margin to the target prediction region in the third image frame in accordance with an overlapping portion between the detected target region in the second image frame and the prediction region in the second image frame.


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