The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Aug. 10, 2021
Applicant:
Wistron Corporation, New Taipei, TW;
Inventors:
Zhao-Yuan Lin, New Taipei, TW;
Jia-Jiun Yang, New Taipei, TW;
Assignee:
Wistron Corporation, New Taipei, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/69 (2023.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0014 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30004 (2013.01);
Abstract
An image processing apparatus and an image-based test strip identification method are provided. In the method, multiple representative values on a first axis of a test strip image are determined. The test strip image is obtained by capturing a test strip. A second axis parallel to a test line or a control line of the test strip is perpendicular to the first axis. A test result of the test strip is determined according to a difference between a first representative value and a second representative value of the representative values. The test result includes a positive result and a negative result.