The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Mar. 04, 2022
Keyence Corporation, Osaka, JP;
Di He, Osaka, JP;
KEYENCE CORPORATION, Osaka, JP;
Abstract
An image inspection apparatus includes a learned neural network storage storing a neural network that previously learns weighting factors between input, intermediate and output layers, and an inferer determining failure/no-failure of a workpiece and classify the workpiece to classes based on an image of the workpiece. The inferer performs first and second inferences. In the first inference, the inferer determines failure/no-failure of the workpiece based on failure/no-failure feature quantities that are obtained by providing the workpiece image to the neural network and a failure/no-failure determination boundary. In the second inference, the inferer define a classification boundary to be used to classify an inspection workpiece to the classes in a feature quantity space of the neural network based on classification feature quantities that represent the different-type classification workpiece images, and classifies a workpiece to the classes based on classification feature quantities of an image of the workpiece and the classification boundary.