The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Mar. 10, 2023
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventor:

Hau Hwang, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 5/73 (2024.01); G06T 5/92 (2024.01); G06T 7/90 (2017.01); H04N 23/76 (2023.01); H04N 23/86 (2023.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 5/73 (2024.01); G06T 5/92 (2024.01); G06T 7/90 (2017.01); H04N 23/76 (2023.01); H04N 23/86 (2023.01); G06T 2207/10024 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Sensor data processing systems and techniques are described. In some examples, a sensor data processing system receives sensor data (e.g., image data). The system receives a sensor data processing parameter that is associated with a sensor data processing function, such as denoising, and that is consistent across the sensor data. The system adjusts a trained machine learning model based on the sensor data processing parameter to generate an adjusted machine learning model. The system processes the sensor data using the adjusted machine learning model to apply the sensor data processing function to the sensor data according to the sensor data processing parameter and to generate processed sensor data (e.g., denoised image data).


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