The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Oct. 19, 2022
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Jose Miguel Serra Lleti, Wetzlar, DE;
Mate Beljan, Wetzlar, DE;
Assignee:
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/10144 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
A computer-implemented method for training a denoising model for a microscope includes obtaining a plurality of training images with different image acquisition settings taken with the microscope, the plurality of training images including noise caused by the microscope's hardware, and training the denoising model using the plurality of training images obtained with different image acquisition settings, thereby making the denoising model specific to the microscope's hardware.