The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 06, 2026
Filed:
Aug. 15, 2022
Chien-lee Liu, Taipei, TW;
Wen-hua Kao, Taipei, TW;
Tzu-chiang MI, Taipei, TW;
Wei-chih Shih, Taipei, TW;
Hsun-hung Wang, Taipei, TW;
Hao-jung Chiou, Taipei, TW;
Yi-hsun Lin, Taipei, TW;
Chien-Lee Liu, Taipei, TW;
Wen-Hua Kao, Taipei, TW;
Tzu-Chiang Mi, Taipei, TW;
Wei-Chih Shih, Taipei, TW;
Hsun-Hung Wang, Taipei, TW;
Hao-Jung Chiou, Taipei, TW;
Yi-Hsun Lin, Taipei, TW;
COMPAL ELECTRONICS, INC., Taipei, TW;
Abstract
A simulation test system and a simulation test method are provided. The simulation test system includes a control device, a power setting device, and a data capture device. The control device generates a context control signal corresponding to one of a plurality of operating contexts. The power setting device generates at least one of a simulated charging power and a simulated load in response to the context control signal and provides at least one of the simulated charging power and the simulated load to a device under test to configure the device under test to generate test data in response to at least one of the simulated charging power and the simulated load. The data capture device captures the test data and provides the test data to the control device.