The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Jul. 09, 2025
Applicants:

Selcuk Uluagac, Miami, FL (US);

Yassine Mekdad, Miami, FL (US);

Yanzhao Wu, Miami, FL (US);

Inventors:

Selcuk Uluagac, Miami, FL (US);

Yassine Mekdad, Miami, FL (US);

Yanzhao Wu, Miami, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/00 (2013.01); G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/577 (2013.01); G06F 2221/033 (2013.01);
Abstract

Systems, methods, and frameworks for automatic vulnerability assessment of machine learning models are provided. The fully automated model-agnostic framework can systemically perform comprehensive adversarial testing across a wide range of public machine learning models. The modular and multi-layered architecture enhances scalability for large-scale vulnerability assessment allowing for more time and resource-efficient approach than existing technologies and tools.


Find Patent Forward Citations

Uluagac, Selcuk. (2026). Systems and methods for automatic vulnerability assessment of machine learning models (U.S. Patent No. 12518025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12518025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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