The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Aug. 21, 2023
Applicant:

Nec Laboratories America, Inc., Princeton, NJ (US);

Inventors:

Wei Cheng, Princeton Junction, NJ (US);

Jingchao Ni, Princeton, NJ (US);

Liang Tong, Lawrenceville, NJ (US);

Haifeng Chen, West Windsor, NJ (US);

Yizhou Zhang, Los Angeles, CA (US);

Assignee:

NEC Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 18/2413 (2023.01); G06F 18/2415 (2023.01); H04B 10/69 (2013.01);
U.S. Cl.
CPC ...
G06F 18/24133 (2023.01); G06F 18/2415 (2023.01); H04B 10/697 (2013.01);
Abstract

Methods and systems for training a model include determining class prototypes of time series samples from a training dataset. A task corresponding to the time series samples is encoded using the class prototypes and a task-level configuration. A likelihood value is determined based on outputs of a time series density model, a task-class distance from a task embedding model, and a task density model. Parameters of the time series density model, the task embedding model, and the task density model are adjusted responsive to the likelihood value.


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