The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Nov. 03, 2021
Applicants:

Shimadzu Corporation, Kyoto, JP;

Kyoto University, Kyoto, JP;

Inventors:

Hiroaki Kozawa, Kyoto, JP;

Yuichiro Fujita, Kyoto, JP;

Yasushi Ishihama, Kyoto, JP;

Kazuyoshi Yoshii, Kyoto, JP;

Assignees:

SHIMADZU CORPORATION, Kyoto, JP;

KYOTO UNIVERSITY, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/16 (2006.01); G01J 3/28 (2006.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G01J 3/28 (2013.01); G06F 17/18 (2013.01);
Abstract

Provided is a method for determining a first N×K matrix S and second K×M matrix P, using factor number K, so that their product SP approximates to an N×M data matrix X obtained by analyzing a sample containing an unknown number of components. Multiple candidates of regularization parameter λr and one sparsity-inducing regularization function R(S,P) are prepared. For each regularization-parameter candidate λr, a candidate Sr of matrix S and candidate Pr of matrix P which minimize a loss function L(S,P)=D(X|SP)+λrR(S,P) are determined, where D(X|SP) is a distance function expressing the degree of difference between X and SP. For each combination of matrix element Xin X and corresponding matrix element (SrPr)in SrPr, a transformed value y=F(X(SrPr)) is determined using function Fwhich performs variable transform from probability distribution Pcorresponding to D(X|(SP)) into common probability distribution Pcommon, and goodness of fit between yand Pcommon is calculated. Among the candidates of λr, a candidate is found which yields the highest value of the goodness of fit, or one which yields the goodness of fit higher than a predetermined threshold and also has the largest value of λr. The matrix candidates Sr and Pr determined for the found λr are selected as the first and second matrices S and P.


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