The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 2026

Filed:

Mar. 28, 2022
Applicant:

Assa Abloy Ab, Stockholm, SE;

Inventors:

Per Nordbeck, Skanör, SE;

Mattias Körkkö, Ödåkra, SE;

Assignee:

ASSA ABLOY AB, Stockholm, SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/0751 (2013.01); G06F 11/0736 (2013.01);
Abstract

It is provided a method for finding faults in firmware for a lock device. The method is performed by a test device. The method comprises the steps of: receiving data indicating an event that results in operation of the firmware in a test lock device, the test lock device being capable of performing at least some of the functions of the lock device; sampling a plurality of measurements that are indicative of power use by the test lock device over time, wherein the measurements are captured to cover at least part of the operation of the firmware by the test lock device based on the event; and determining that a potential fault occurs in the firmware for the event when the sampled measurements fail to correspond to the event, based on previously recorded data for the same type of event.


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